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Using Error Compensation for Defect Tolerance of Nano-Systems*
Masoud Hashempour • Zahra Mashreghian Arani • Fabrizio Lombardi
Keywords: Fault-Tolerance • Nanotechnology • Bifurcation • Multiplexing • Circuit Model
Fingerprint Partial Matching using a Minutiae-based Combined Feature
Monireh Abdoos • Nasser Mozayani
Keywords: Minutiae • Combined Feature • Partial Image • Alignment • Bifurcation Points • Ending Points
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